Showing results: 691 - 705 of 734 items found.
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40-252-011 -
Pickering Interfaces Ltd.
The 40-252-011 is a programmable resistor module with 4 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-253-112 -
Pickering Interfaces Ltd.
The 40-253-112 is a programmable resistor module with 1 channel which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-251-010 -
Pickering Interfaces Ltd.
The 40-251-010 is a programmable resistor module with 8 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-252-112 -
Pickering Interfaces Ltd.
The 40-252-112 is a programmable resistor module with 2 channels which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-252-111 -
Pickering Interfaces Ltd.
The 40-252-111 is a programmable resistor module with 2 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-252-113 -
Pickering Interfaces Ltd.
The 40-252-113 is a programmable resistor module with 2 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-252-110 -
Pickering Interfaces Ltd.
The 40-252-110 is a programmable resistor module with 2 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-251-012 -
Pickering Interfaces Ltd.
The 40-251-012 is a programmable resistor module with 8 channels which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Automator Pneumatic Family -
Test Electronics
Designed to provide factory assembly line conveyor based pneumatically actuated full test automation. Interchangeable pneumatics and manual lever options provide operation as a fully automated tester or as a manual bench top tester. These functional interchangeable options allow this fixture to grow with you as your production volumes increase. Test plate changeover is a quick 2 minute job. 4 thumbscrews to change the bottom plate and 4 SHC screws to change the top plate. The top plate drops down and slides out with the connector assembly. The bottom plate lifts up and out. The new plates slide back in. All rear panel connectors are mounted to the aluminum bracket on the top plate. This whole top plate assembly slides out together eliminating wiring hassles. Double sided access plate sets use transfer pins to get the signals from the bottom plate up to the top plate.
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Automator Manual Family -
Test Electronics
Designed to provide factory assembly line conveyor based pneumatically actuated full test automation. Interchangeable pneumatics and manual lever options provide operation as a fully automated tester or as a manual bench top tester. These functional interchangeable options allow this fixture to grow with you as your production volumes increase. Test plate changeover is a quick 2 minute job. 4 thumbscrews to change the bottom plate and 4 SHC screws to change the top plate. The top plate drops down and slides out with the connector assembly. The bottom plate lifts up and out. The new plates slide back in. All rear panel connectors are mounted to the aluminum bracket on the top plate. This whole top plate assembly slides out together eliminating wiring hassles. Double sided access plate sets use transfer pins to get the signals from the bottom plate up to the top plate.
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Testhouse Ltd
Mobile testing ensures the quality of applications and other digital properties running on mobile devices. The dynamism, complexity and competitive nature of the mobile application space makes it imperative that publishers choose a highly responsive and well-equipped test partner to ensure the greatest user experience of their digital properties across all types of mobile devices.- Mobile testing involves all testing types (functional, performance, etc).- Mobile application testing involves thousands of complex parameters- Mobile applications see faster development iterations and hence have to be tested more frequently than at the normal application SDLC.- DevOps practices become indispensable in mobile testing as you have to anticipate and stay one step ahead of changes in the market
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TS-217 -
Marvin Test Solutions, Inc.
The TS-217 is an I-level and Depot-level Universal Launcher test set supporting fighter aircraft launchers including the LAU-127, LAU-128, and LAU-129 (AMRAAM), LAU-117 and LAU-88 (Maverick), and LAU-7 (Sidewinder) missile launchers, launcher electronic assemblies, launcher power supplies, and circuit cards. The TS-217 is also used as a depot-level tester for F-18 armament including launchers (LAU-127, LAU-7, LAU-115, and LAU-116), bomb racks (BRU-32), and aircraft pylons (SUU-62 and SUU-63). Additionally, the TS-217 supports MAU-169 Paveway kits, subassemblies, and circuit cards. The TS-217 performs full parametric functional testing as well as troubleshooting to the faulty LRU (I-Level configuration) and SRU (Depot-Level configuration). The TS-217 can be used as an I-Level tester or as a Depot / Acceptance tester for launcher subassemblies.
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Ironwood Electronics
Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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AIM GmbH
AIM’s AFDX®/ARINC664P7 test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. Versions are available to support the Boeing specific ARINC664P7 extensions.
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782835-37 -
NI
256-Crosspoint, 4x64, 2-Wire PXI Matrix Switch Module—The PXIe‑2737 is a high‐density 4x64 PXI matrix switch module designed for routing signals within automated test systems and using electromechanical relays to perform immediate switch operations. It also offers features to monitor the health of deployed systems and plan for predictive maintenance, including onboard relay count tracking, a temperature sensor, and functional and resistive relay self-tests available through the NI Switch Health Center.
